NEW SPEED TECHNOLOGY PTE LTD
|Okano ICT Model AT-01 Series|
Okano AT-01 ICT - Machine Features
Auto - Test
In addition, it
improves the work efficiency and
minimizing the false rejects during test
by system auto retry function for those
It provides 3 kinds of Screens View display (Select Graphic View) in Menu. The measured value of the selected step is indicated with graph display.
The location of the selected component also indicated in the display for easy finding purpose.
Excel Data Compatibility
It provides Data Compatibility between System Test Data and Excel Data.
Test Data is easily transportable between System Test Data area and Excel data area by simple "Copy" and "Paste" function
Mode, Range Test & Auto Generation function
It automatically generate the correct test mode and range for the designated component listed in the System Test Data.
It makes test program generation much quicker and less error and reduce the time needed for test program generation.
Various Graphic Display function
Failure components are indicated on the graphic display for easy finding and locating of the components.
Auto Guard Pin
Auto guard pin function auto generate the most suitable Guard Pin automatically for all components on PCB.
It prevents unauthorized modification of the test program data.
3 user level are provided for ease of system control :- "Operator", "Technician", "Engineer"
Measurement board and relay board diagnostics check are provided to help isolation and identify system failure.
Bar Code Editor
It provides easy management and report information of the board status by reading the serial No. of PCB with Bar Code reader.
Network Remote Control
Network provides high quality control and management efficiency for the production.
It provides real time data information and control over the production lines.
FrameScan & DeltaScan
Frame Scan & Delta Scan
are developed by Teradyne co. in
America, and these are mainly used to
test the problem happen to PCB
manufacturing process such as cold
soldering and resistive solder joints of
IC etc. Recently, the spread of SMT IC
has increased and high densification is
proceeding to improve the package from
DIP to PGA, BGA and CSP more and more.
AT-01 is featured to have high speed,
reliability and low-cost corresponding
to technological aggress, which
FrameScan & DeltaScan are applied.
Excels in testing
connectors and sockets
Very fast test generation
No device functionality
Precise diagnostics to
Tests not often
influenced by board topology
In order to test whether
or not IC assembly on PCB is accurate,
Delta Scan tests the variation of DC
current through Protect diode of each
pin. For the OFF state of PCB power
source, certain 2 pins on device always
indicate the equivalent circuit as
No fixture hardware
No device package
Detects several fault
classes, including cold solder joints
Most effective on large
Fast execution and
Gray code or vector tests
* Fault class coverage :
Open pin, blown bond wires, blown
drivers, blown diodes, Misoriented
devices, single power/ground pins
Boundary-scan, as defined
by the IEEE Std. 1149.1 standard, is an
integrated method for testing
interconnects on printed circuit boards
that is implemented at the IC level. The
inability to test highly complex and
dense printed circuit boards using
traditional in-circuit testers and bed
of nail fixtures was already evident in
the mid eighties. Due to physical space
constraints and loss of physical access
to fine pitch components and BGA
devices, fixturing cost increased
dramatically while fixture reliability
decreased at the same time.
In the 1980s, the Joint
Test Action Group (JTAG) developed a
specification for boundary-scan testing
that was standardized in 1990 as the
IEEE Std. 1149.1-1990. In 1993 a new
revision to the IEEE Std. 1149.1
standard was introduced (titled 1149.1a)
and it contained many clarifications,
corrections, and enhancements. In 1994,
a supplement that contains a description
of the boundary-scan Description
Language (BSDL) was added to the
Applications are found in
high volume, high-end consumer products,
telecommunication products, defense
systems, computers, peripherals, and
Boundary-Scan Test Advantages
Stuck-at fault, Bridge
fault 100% Detection
Flash memory programming
To reduce Test
To reduce Test cost
Easy to find Fault
Easy to debug at the
New Speed Technology Pte Ltd ( 27, Mandai Estate, #07-02, Tower 2, Innovation Place, Singapore 729931 )
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